Salamon, Michael; Fraunhofer-Institut fur Integrierte Schaltungen; Germany
Salamon, M.; Fraunhofer Institute for Integrated Circuits IIS; Germany
Kreutner, C.; Fraunhofer Institute for Integrated Circuits IIS; Germany
Leisner, J.; Fraunhofer Institute for Integrated Circuits IIS; Germany
Reims, N.; Fraunhofer Institute for Integrated Circuits IIS; Germany
Reisser, J.; Fraunhofer Institute for Integrated Circuits IIS; Germany
Uhlmann, N.; Fraunhofer Institute for Integrated Circuits IIS; Germany
Brock, A.; Xray-lab GmbH & Co. KG; Germany
Thiemeyer, N.; Xray-lab GmbH & Co. KG; Germany
Greiwe, G.-H.; Xray-lab GmbH & Co. KG; Germany
Kinzinger, J.; Xray-lab GmbH & Co. KG; Germany
Hartnagel, U.; Xray-lab GmbH & Co. KG; Germany
Session: CT-Methods 1
Time: 11:10 - 11:30
The industrial application of computed tomography is growing continuously since its introduction into the non-destructive testing market in the early 90’s. Compared to the radioscopy technique widespread along the electronics and Al-casting industry the growth is stunted due to the higher scan efforts deriving from a large number of projections required for a single scan. Beside the high initial costs for a CT system the costs per scan limit the application of CT to highly valuable parts. The objective to lower the costs of a single inspection can be addressed by increasing the performance of each CT component or by adapting the system specifically to the application. In today’s CT market both cases can only be accessed based on the purchase of a new CT system. Upgrades or extensions for existing CT systems are rarely deployed by the manufacturers and are limited to post-processing software from third parties. The encapsulation of the integral image acquisition process chain of a CT system inhibits third parties from interaction with the hardware and the customer from benefiting from latest developments.
In order to address the increasing request for serial application of CT close to the production floor a manufacturer independent tool called PolyCT has been developed providing a throughput enhancement to existing industrial CT systems. By extending the number of CT turntables to e.g. three, several objects can be scanned simultaneously, even if the X-ray penetration capability would not allow scanning them in a side by side orientation. Artifacts resulting from the single-rotation-axis multi-target scan at one third of scan time per part. The main idea behind the PolyCT is to avoid any software interaction with the CT acquisition process in order to make it usable for any CT system. The reconstruction of the so acquired data is based on the Fraunhofer EZRT software provided with the PolyCT. By an interface to the projection data supplied for all common CT systems a direct reconstruction of each object is conducted considering the local acquisition geometry. In this contribution we present the functional principle of PolyCT and the achievable results.