Novel Imaging Techniques for Defects Characterisation in Phased Array Inspection

Speaker:
Turcotte, Jonathan; Sonatest; Canada

Authors:
Rioux, P.; Sonatest; Canada
Lachance, F.; Sonatest; Canada
Giguere, D.; Sonatest; Canada
Turcotte, J.; Sonatest; Canada

ID: ECNDT-0126-2018
Download: PDF
Session: PAUT & TFM 3
Room: G2
Date: 2018-06-12
Time: 09:20 - 09:40

Phased Array ultrasonic testing has demonstrated over the years that it has many advantages compared to conventional techniques: fast, reliable, with higher resolution and sensitivity. While it took time to catch up in the field, it is now widely considered as the go-to technique for complex inspections. At the same time, technology has continued to evolve, thus increasing the possibilities ultrasonic NDT techniques. With increased computing power and better capability to manage large data set of new generation ultrasonic equipment, advanced imaging techniques like TFM are now available. Unfortunately, these techniques are not yet recognized by standards and can’t be used alone during the critical inspection. On the other hand, they can be a big help in improving defects characterisation when used in conjunction with standards-approved methods. In this paper, we will demonstrate that the combination of Phased Array inspection with advanced imaging techniques, can enhance the defects characterisation process for common applications of ultrasonic testing.